| 摘要 |
<p>A probe system is disclosed. The probe system includes a support member which is arranged on the upper side of a base plate and grips a circuit board to be vertical to the base plate, at least one probe tip member which includes a probe in contact with a conductive pattern formed on the circuit board, a guide arm member which includes a first horizontal movement unit which is combined with the base plate to reciprocate in a first horizontal direction, a second horizontal movement unit which is combined with the base plate to reciprocate in a second horizontal direction, a rotation movement unit which is combined with a lateral side of the second horizontal movement unit and can be rotated, and a guide unit which is combined with the rotation movement unit and the probe tip member, and a network analysis device which is electrically connected to the probe of the probe tip member, and analyzes the electromagnetic properties of the conductive pattern.</p> |
