发明名称 SEMICONDUCTOR DEVICE HAVING A GAP DEFINED THEREIN
摘要 In a particular embodiment, a method includes forming a first spacer structure on a dummy gate of a semiconductor device and forming a sacrificial spacer on the first spacer structure. The method also includes etching a structure of the semiconductor device to create an opening, removing the sacrificial spacer via the opening, and depositing a material to close to define a gap.
申请公布号 US2015255571(A1) 申请公布日期 2015.09.10
申请号 US201414341568 申请日期 2014.07.25
申请人 QUALCOMM Incorporated 发明人 Xu Jeffrey Junhao;Rim Kern;Zhu John Jianhong;Song Stanley Seungchul;Badaroglu Mustafa;Machkaoutsan Vladimir;Yang Da;Yeap Choh Fei
分类号 H01L29/66;H01L29/78 主分类号 H01L29/66
代理机构 代理人
主权项 1. A method comprising: forming a first spacer structure on a dummy gate of a semiconductor device; forming a sacrificial spacer on the first spacer structure; etching a structure to create an opening; and removing the sacrificial spacer via the opening and depositing a material to close the opening to define a gap.
地址 San Diego CA US