发明名称 |
SEMICONDUCTOR DEVICE |
摘要 |
A method for forming an oxide that can be used as a semiconductor of a transistor or the like is provided. In particular, a method for forming an oxide with fewer defects such as grain boundaries is provided. One embodiment of the present invention is a semiconductor device including an oxide semiconductor, an insulator, and a conductor. The oxide semiconductor includes a region overlapping with the conductor with the insulator therebetween. The oxide semiconductor includes a crystal grain with an equivalent circle diameter of 1 nm or more and a crystal grain with an equivalent circle diameter less than 1 nm. |
申请公布号 |
US2015255534(A1) |
申请公布日期 |
2015.09.10 |
申请号 |
US201514636477 |
申请日期 |
2015.03.03 |
申请人 |
Semiconductor Energy Laboratory Co., Ltd. |
发明人 |
YAMAZAKI Shunpei;YAMADA Yoshinori;NONAKA Yusuke;OOTA Masashi;KUROSAWA Yoichi;ISHIHARA Noritaka;HAMADA Takashi;ICHIJO Mitsuhiro;EGI Yuji |
分类号 |
H01L29/04;H01L29/36;H01L29/786 |
主分类号 |
H01L29/04 |
代理机构 |
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代理人 |
|
主权项 |
1. A semiconductor device comprising:
an oxide semiconductor; an insulator; and a conductor, wherein the oxide semiconductor overlaps with the conductor with the insulator therebetween, and wherein the oxide semiconductor comprises a crystal grain with an equivalent circle diameter of 1 nm or more and a crystal grain with an equivalent circle diameter less than 1 nm. |
地址 |
Atsugi-shi JP |