发明名称 Method and Apparatus for Plasma Dicing a Semi-conductor Wafer
摘要 The present invention provides a method for plasma dicing a substrate. The method comprising providing a process chamber having a wall; providing a plasma source adjacent to the wall of the process chamber; providing a work piece support within the process chamber; placing the substrate onto a support film on a frame to form a work piece work piece; loading the work piece onto the work piece support; providing a clamping electrode for electrostatically clamping the work piece to the work piece support; providing a mechanical partition between the plasma source and the work piece; generating a plasma through the plasma source; and etching the work piece through the generated plasma.
申请公布号 US2015255297(A1) 申请公布日期 2015.09.10
申请号 US201514721462 申请日期 2015.05.26
申请人 Plasma-Therm LLC 发明人 Martinez Linnell;Pays-Volard David;Johnson Chris;Johnson David;Westerman Russell;Grivna Gordon M.
分类号 H01L21/3065;H01L21/683;H01L21/687;H01L21/78 主分类号 H01L21/3065
代理机构 代理人
主权项 1. (canceled)
地址 St. Petersburg FL US