发明名称 |
Guard Rings on Fin Structures |
摘要 |
A method includes forming a gate stack over a semiconductor fin, wherein the semiconductor fin forms a ring, and etching a portion of the semiconductor fin not covered by the gate stack to form a recess. The method further includes performing an epitaxy to grow an epitaxy semiconductor region from the recess, forming a first contact plug overlying and electrically coupled to the epitaxy semiconductor region, and forming a second contact plug, wherein the second contact plug is overlying and electrically coupled to the gate stack. |
申请公布号 |
US2015255351(A1) |
申请公布日期 |
2015.09.10 |
申请号 |
US201514719586 |
申请日期 |
2015.05.22 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Hu Chia-Hsin;Liang Min-Chang |
分类号 |
H01L21/8234 |
主分类号 |
H01L21/8234 |
代理机构 |
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代理人 |
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主权项 |
1. A method comprising:
forming a semiconductor fin, wherein the semiconductor fin forms a ring; forming a plurality of gate stacks on sidewalls and a top surface of each of sides of the ring; epitaxially growing a plurality of epitaxy regions between the plurality of gate stacks; and forming a plurality of metal contact plugs, each being over, and electrically coupling to, one of the plurality of epitaxy regions. |
地址 |
Hsin-Chu TW |