发明名称 Guard Rings on Fin Structures
摘要 A method includes forming a gate stack over a semiconductor fin, wherein the semiconductor fin forms a ring, and etching a portion of the semiconductor fin not covered by the gate stack to form a recess. The method further includes performing an epitaxy to grow an epitaxy semiconductor region from the recess, forming a first contact plug overlying and electrically coupled to the epitaxy semiconductor region, and forming a second contact plug, wherein the second contact plug is overlying and electrically coupled to the gate stack.
申请公布号 US2015255351(A1) 申请公布日期 2015.09.10
申请号 US201514719586 申请日期 2015.05.22
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Hu Chia-Hsin;Liang Min-Chang
分类号 H01L21/8234 主分类号 H01L21/8234
代理机构 代理人
主权项 1. A method comprising: forming a semiconductor fin, wherein the semiconductor fin forms a ring; forming a plurality of gate stacks on sidewalls and a top surface of each of sides of the ring; epitaxially growing a plurality of epitaxy regions between the plurality of gate stacks; and forming a plurality of metal contact plugs, each being over, and electrically coupling to, one of the plurality of epitaxy regions.
地址 Hsin-Chu TW