发明名称 |
Method and Apparatus for Calibrating a Charged Particle Pencil Beam Used for Therapeutic Purposes |
摘要 |
A system for calibrating a charged particle pencil beam includes a first pixelated detector, a second pixelated detector, a beam stop, and a diagnostics system. The first and second pixelated detectors measure the pencil beam at positions proximal and/or distal to an isocenter plane. The beam stop is configured to detect an energy level of the pencil beam. The diagnostics system is configured to transmit a signal to request a generation of the charged particle pencil beam at different settings. The diagnostics system is also configured to update a calibration parameter for each setting based on the data received from the pixelated detectors and the beam stop. |
申请公布号 |
US2015251021(A1) |
申请公布日期 |
2015.09.10 |
申请号 |
US201514641932 |
申请日期 |
2015.03.09 |
申请人 |
Pyramid Technical Consultants, Inc. |
发明人 |
Boisseau R. Paul;Gordon John;Nett William P. |
分类号 |
A61N5/10;G01T1/29 |
主分类号 |
A61N5/10 |
代理机构 |
|
代理人 |
|
主权项 |
1. A system for calibrating a charged particle pencil beam, the system comprising:
a first pixelated detector disposed at a proximal position to an isocenter plane, the first pixelated detector configured to provide a first output representative of first data of the charged particle pencil beam; a second pixelated detector disposed at a first position distal to the isocenter plane, the second pixelated detector configured to provide a second output representative of second data of the charged particle pencil beam; and a beam stop disposed at a second position distal to the second pixelated detector, the beam stop configured to provide a third output representative of an energy of the charged particle pencil beam, wherein the second pixelated detector is disposed between the isocenter plane and the beam stop; a diagnostics system comprising a processor and a memory, the diagnostics system configured (a) to transmit a signal to request a generation of the charged particle pencil beam at a plurality of settings; and (b) to update a calibration parameter for each setting based on at least one of the first output, the second output, and the third output. |
地址 |
Lexington MA US |