SYSTEM AND METHOD FOR CLOUD TESTING AND REMOTE MONITORING OF INTEGRATED CIRCUIT DEVICES

摘要

In a system and method for cloud testing and remote monitoring of IC devices on a computerized test platform, the computerized test platform sends to a cloud server unit, which stores test programs corresponding respectively to different test items, a test request, which includes respective device codes of the IC devices and one(s) of the test items, via a communication network. The cloud server unit sends to the computerized test platform a test response, which includes one(s) of the test programs corresponding to the one(s) of the test items. The computerized test platform products test data corresponding to the device codes of the IC devices in response to execution of the one(s) of the test programs.

主权项

1. A system for cloud testing and remote monitoring of a plurality of integrated circuit (IC) devices, each of the IC devices having a unique device code, the system comprising:
a testing apparatus including
a computerized test platform that has a unique test platform code and that is provided with a multi-interface connector unit, which is used to connect with the IC devices, anda network interface unit; and a cloud server unit connected to a communication network, said cloud server unit including a database for storing a plurality of test programs that correspond respectively to a plurality of different test items; wherein, when said testing apparatus establishes, using said network interface unit, a communication link with said cloud server unit over the communication network, said testing apparatus is operable to send a test request to said cloud server unit via the communication link, the test request including the device codes of the IC devices connected to said computerized test platform, the test platform code of said computerized test platform, and at least one of the test items that is associated with the IC devices, in response to receipt of the test request from said testing apparatus, said cloud server unit is operable to send a test response to said testing apparatus via the communication link, the test response including at least one of the test programs that is stored in said database and that corresponds to said at least one of the test items, and upon receipt of the test response from said cloud server unit, said computerized test platform is operable to produce test data that corresponds to the device codes of the IC devices in response to execution of said at least one of the test programs.