| 摘要 |
Described are systems and methods of determining DC offset voltages in IQ modulators. First, two different DC test voltages are selected for one of the inputs to the IQ modulator. Then, a first test voltage is applied to one input to the IQ modulator while test data is generated by measuring outputs from a set of signals applied to the other input to the IQ modulator. Then the second test voltage is applied and another set of test data generated. From the first and second sets of test data, second-order polynomial functions may be constructed and compared to one another to yield a ratio of power value outputs. Then the DC offset voltages may be determined from the ratio of power value outputs. |
