发明名称 Systems and methods for X-ray diffraction
摘要 An x-ray diffraction system (100) includes an x-ray source (102) having a first interchangeable x-ray generating component (104), a second interchangeable x-ray generating component (106), an actuator (108) and a controller (110) operatively connected to the actuator. The first and second interchangeable x-ray generating components (104, 106) are interchangeable with one another. The actuator (110) is operatively connected to the first and second interchangeable x-ray generating components (104, 106). A method for non-destructive x-ray diffraction includes emitting a first x-ray beam from an x-ray source with a first x-ray generating component based on a first desired depth to measure a crystallographic signature of a sample at the first desired depth, interchanging the first x-ray generating component (104) with a second x-ray generating component (106) to form a modified x-ray source, and emitting a second x-ray beam from the modified x-ray source based on a second desired depth, to non-destructively measure a crystallographic signature of the sample at the second desired depth.
申请公布号 EP2916340(A1) 申请公布日期 2015.09.09
申请号 EP20150157955 申请日期 2015.03.06
申请人 UNITED TECHNOLOGIES CORPORATION 发明人 CERNATESCU, IULIANA;FURRER, DAVID U.
分类号 H01J35/26;G01N23/20 主分类号 H01J35/26
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