发明名称 検査用接触子及び検査用治具
摘要 <p>Provided is a micro contact element which is capable of coping with the miniaturization and greater complexity of substrates or boards, which is simplified due to a reduction in the number of components, and which creates sufficient contact pressure and stroke. Also provided is an inspection jig using this contact element. An inspection contact element having the contact pressure and amount of contraction required to carry out an inspection is formed by using notch parts respectively formed in two conductive cylindrical members having different outer and inner diameters so that the notch parts can function as elastic parts, and combining the two cylindrical members in such a way that the elastic parts are arranged in parallel or in series.</p>
申请公布号 JP5776687(B2) 申请公布日期 2015.09.09
申请号 JP20120511637 申请日期 2011.04.15
申请人 发明人
分类号 G01R1/067;H01L21/66 主分类号 G01R1/067
代理机构 代理人
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