发明名称 半導体装置及びその作製方法
摘要 <p>A method for manufacturing a thin film transistor having high electric characteristics with high productivity. In the method for forming a channel region of a dual-gate thin film transistor including a first gate electrode and a second gate electrode which faces the first gate electrode with the channel region provided therebetween, a first microcrystalline semiconductor film is formed under a first condition for forming a microcrystalline semiconductor film in which a space between crystal grains is filled with an amorphous semiconductor, and a second microcrystalline semiconductor film is formed over the first microcrystalline semiconductor film under a second condition for promoting crystal growth.</p>
申请公布号 JP5775322(B2) 申请公布日期 2015.09.09
申请号 JP20110034587 申请日期 2011.02.21
申请人 发明人
分类号 H01L21/336;G02F1/1368;H01L29/423;H01L29/49;H01L29/786 主分类号 H01L21/336
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