发明名称 Wavelength-tunable interference filter, optical module, and optical analysis apparatus
摘要 A wavelength-tunable interference filter comprising a first substrate, a second substrate facing the first substrate, a first reflective film provided on the first substrate, a second reflective film provided on the second substrate, the second reflective film facing the first reflective film, a first electrode provided on the first substrate, and a second electrode provided on the second substrate, the second electrode facing the first electrode, wherein the first electrode includes a first electrode layer and a second electrode layer, the first electrode layer has a first in-plane internal stress which is compressive, and the second electrode layer has a second in-plane internal stress which is tensile.
申请公布号 US9128279(B2) 申请公布日期 2015.09.08
申请号 US201113216509 申请日期 2011.08.24
申请人 Seiko Epson Corporation 发明人 Sano Akira
分类号 G01N21/25;G01B9/02;G02B26/00;G01J3/26;G01J3/46;G01J3/50 主分类号 G01N21/25
代理机构 Harness, Dickey & Pierce, P.L.C. 代理人 Harness, Dickey & Pierce, P.L.C.
主权项 1. A wavelength-tunable interference filter comprising: a first substrate; a second substrate facing the first substrate; a first reflective film provided on the first substrate; a second reflective film provided on the second substrate, the second reflective film facing the first reflective film; a first electrode provided on the first substrate, the first electrode provided at an outer periphery of the first reflective film; and a second electrode provided on the second substrate, the second electrode facing the first electrode, wherein the first electrode is configured by stacking a first electrode layer, a second electrode layer and a third electrode layer in series, the first electrode layer has a first in-plane internal stress which is compressive, the first electrode layer is a metal oxide film and conductive, the second electrode layer has a second in-plane internal stress which is tensile, the second electrode layer is a metal film, and the third electrode layer has a third in-plane internal stress which is tensile, the third electrode layer is a metal film which is different from the second electrode layer.
地址 JP