On-chip detection of types of operations tested by an LBIST

摘要

An integrated circuit includes an LBIST controller operative to run a test program on at least one selection of core logic of the integrated circuit to test the operability of the at least one selection of core logic. The integrated circuit also includes a monitoring logic structure operative to detect at least one type of operation executed for the test program from at least one particular control signal activated by the LBIST controller for controlling the at least one selection of core logic to execute the test program from among at least one control signal for controlling operations on the at least one selection of core logic.

主权项

1. A method for monitoring operations run by a Logic Built-In Self Test (LBIST), the method comprising:
providing, on an integrated circuit comprising an LBIST controller, LBIST monitoring logic to monitor at least one control signal for controlling at least one selection of core logic under test on the integrated circuit; tracking, by the LBIST monitoring logic, while a test program is run by the LBIST controller on the at least one selection of core logic under test, whether each at least one control signal is set to an active state; and producing, by the LBIST monitoring logic, a result of the tracking of each at least one control signal for output to a tester, wherein the result indicates each at least one type of operation actually executed on the at least one selection of core logic under test for the test program, such that the tester reading the result is enabled to determine whether each at least one type of operation actually executed on the at least one selection of core logic under test matches an expected at least one type of operation to be executed for the test program.