发明名称 |
Microelectronic devices and microelectronic support devices, and associated assemblies and methods |
摘要 |
Microelectronic devices, associated assemblies, and associated methods are disclosed herein. For example, certain aspects of the invention are directed toward a microelectronic device that includes a microfeature workpiece having a side and an aperture in the side. The device can further include a workpiece contact having a surface. At least a portion of the surface of the workpiece contact can be accessible through the aperture and through a passageway extending between the aperture and the surface. Other aspects of the invention are directed toward a microelectronic support device that includes a support member having a side carrying a support contact that can be connectable to a workpiece contact of a microfeature workpiece. The device can further include recessed support contact means carried by the support member. The recessed support contact means can be connectable to a second workpiece contact of the microfeature workpiece. |
申请公布号 |
US9129862(B2) |
申请公布日期 |
2015.09.08 |
申请号 |
US201414331722 |
申请日期 |
2014.07.15 |
申请人 |
Micron Technology, Inc. |
发明人 |
Lee Teck Kheng;Chai David Yih Ming;Ng Hong Wan |
分类号 |
H01L21/00;H01L23/02;H01L23/12;H01L21/768;H01L23/13;H01L23/31;H01L23/48;H01L23/00 |
主分类号 |
H01L21/00 |
代理机构 |
Perkins Coie LLP |
代理人 |
Perkins Coie LLP |
主权项 |
1. A microelectronic support device, comprising:
a support member having a first side, a second side, and a passageway extending through the support member between a first aperture in the first side and a second aperture in the second side; a support contact having a first surface and a second surface, the support contact being carried by the second side and being positioned to cover at least a portion of the second aperture, at least a portion of the first surface of the support contact being positioned to be accessible through the first aperture and the passageway; and a bond wire connected to the first surface of the support contact, the bond wire having a portion extending through the first aperture. |
地址 |
Boise ID US |