发明名称 Method of reading memory cells with different threshold voltages without variation of word line voltage and nonvolatile memory device using the same
摘要 A soft-decision read method of a nonvolatile memory device includes receiving a soft-decision read command, applying a read voltage to a selected word line, pre-charging bit lines respectively connected to selected memory cells of the selected word line, continuously sensing states of the selected memory cells. The pre-charged voltages of the bit lines and the read voltage supplied to the selected word line are not varied during the sensing states of the selected memory cells.
申请公布号 US9129696(B2) 申请公布日期 2015.09.08
申请号 US201414340773 申请日期 2014.07.25
申请人 Samsung Electronics Co., Ltd. 发明人 Joo Sang-Hyun;Song Kiwhan;Lee Ju Seok;Choi Kihwan
分类号 G11C16/08;G11C16/26;G11C11/56;G11C16/04 主分类号 G11C16/08
代理机构 Volentine & Whitt, PLLC 代理人 Volentine & Whitt, PLLC
主权项 1. A read method of a nonvolatile memory device which includes memory cells, the read method comprising: supplying a read voltage to a selected word line connected to a selected memory cell; applying a pre-charged voltage to a bit line connected to the selected memory cell; varying voltage of a sensing node corresponding to the bit line connected to the selected memory cell during a first time; latching the varied voltage of the sensing node as first data; boosting the sensing node by using a capacitor connected to the sensing node; varying voltage of the sensing node corresponding to the bit line connected to the selected memory cell during a second time different from the first time; and latching the varied voltage of the boosted sensing node as second data, wherein the read voltage applied to the selected word line and the pre-charged voltage applied to the bit line are maintained constantly during the first time and the second time.
地址 Suwon-si, Gyeonggi-do KR