发明名称 Method and apparatus for on-chip debugging
摘要 The present invention provides a method and apparatus for dynamically configuring debug triggering patterns. One example embodiment of the method includes comparing values of bits received on a first subset of a plurality of lines of a bus with a first pattern of bits and capturing values of bits received on a second subset of the plurality of lines of the bus in response to the comparison indicating that the values of the bits received on the first subset of the lines match the first pattern of bits. The exemplary embodiment of the method also includes defining a second pattern for triggering a debug action using the captured values.
申请公布号 US9129061(B2) 申请公布日期 2015.09.08
申请号 US201213557756 申请日期 2012.07.25
申请人 Advanced Micro Devices, Inc. 发明人 Nixon Scott P.;Lu Tiger;Rentschler Eric M.
分类号 G06F11/36 主分类号 G06F11/36
代理机构 代理人
主权项 1. A method, comprising: comparing values of bits received on a first subset of a plurality of lines of a bus with a first pattern of bits; during a time interval that is aligned with a time interval during which the values of the bits received on the first subset of the lines match the first pattern, capturing values of bits received on a second subset of the plurality of lines of the bus in response to the comparison indicating that the values of the bits received on the first subset of the lines match the first pattern of bits; and defining a second pattern of bits for triggering a debug action using the captured values.
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