发明名称 FinFET and method of manufacturing the same
摘要 A FinFET includes a fin structure, a gate and a source-drain region. The fin structure is over a substrate and has a recess of an upper surface of the fin structure and a doped region in the fin structure and adjacent to the recess. The gate protrudes from the recess and across over the fin structure. The source-drain region is in the fin structure and adjacent to the doped region. Methods for forming the FinFET are also provided.
申请公布号 US9129988(B1) 申请公布日期 2015.09.08
申请号 US201414555439 申请日期 2014.11.26
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 Lee Wei-Yang;Chen Ting-Yeh;Chan Chia-Ling;Chan Chien-Tai
分类号 H01L21/00;H01L29/66 主分类号 H01L21/00
代理机构 Maschoff Brennan 代理人 Maschoff Brennan
主权项 1. A method of manufacturing a FinFET, comprising: forming a fin structure over a substrate; forming a dummy gate that crosses over the fin structure; forming a doped region in the fin structure using a plasma doping process and an annealing process; forming a source-drain region in the doped region; removing the dummy gate and a portion of the fin structure beneath the dummy gate to form a cavity; and forming a gate in the cavity.
地址 Hsinchu TW