发明名称 |
FinFET and method of manufacturing the same |
摘要 |
A FinFET includes a fin structure, a gate and a source-drain region. The fin structure is over a substrate and has a recess of an upper surface of the fin structure and a doped region in the fin structure and adjacent to the recess. The gate protrudes from the recess and across over the fin structure. The source-drain region is in the fin structure and adjacent to the doped region. Methods for forming the FinFET are also provided. |
申请公布号 |
US9129988(B1) |
申请公布日期 |
2015.09.08 |
申请号 |
US201414555439 |
申请日期 |
2014.11.26 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
Lee Wei-Yang;Chen Ting-Yeh;Chan Chia-Ling;Chan Chien-Tai |
分类号 |
H01L21/00;H01L29/66 |
主分类号 |
H01L21/00 |
代理机构 |
Maschoff Brennan |
代理人 |
Maschoff Brennan |
主权项 |
1. A method of manufacturing a FinFET, comprising:
forming a fin structure over a substrate; forming a dummy gate that crosses over the fin structure; forming a doped region in the fin structure using a plasma doping process and an annealing process; forming a source-drain region in the doped region; removing the dummy gate and a portion of the fin structure beneath the dummy gate to form a cavity; and forming a gate in the cavity. |
地址 |
Hsinchu TW |