发明名称 Solid-state imaging device and image capturing apparatus including the same
摘要 A solid-state imaging device including: a plurality of pixels which are on a same semiconductor substrate and each of which generates a pixel signal; a comparison circuit that is connected to the pixels in each of columns; a D/A conversion circuit that generates a comparison potential and provide the generated comparison potential in common to the comparison circuit in each column; and a D/A conversion circuit output unit provided in a common line for providing the comparison potential to the comparison circuit in each column, wherein the D/A conversion circuit output unit includes: a source follower circuit that is provided to the line and includes a first current source having a transistor, and an amplification transistor having a gate oxide film that is thinner than a gate oxide film of the transistor; and a voltage control circuit that controls a drain-to-source voltage of the amplification transistor.
申请公布号 US9131177(B2) 申请公布日期 2015.09.08
申请号 US201414293169 申请日期 2014.06.02
申请人 PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD. 发明人 Shishido Sanshiro;Abe Yutaka;Higuchi Masahiro;Ikuma Makoto
分类号 H04N5/335;H04N5/3745;H04N5/378;H01L27/146;H04N5/357 主分类号 H04N5/335
代理机构 Wenderoth, Lind & Ponack, L.L.P. 代理人 Wenderoth, Lind & Ponack, L.L.P.
主权项 1. A solid-state imaging device comprising: a plurality of pixels which are arranged in rows and columns on a same semiconductor substrate and each of which generates a pixel signal according to an amount of received light; a comparison circuit that is connected in common to the pixels in each of the columns and compares the pixel signal to a comparison signal that is a comparison criterion; a comparison signal generating unit configured to generate the comparison signal and provide the comparison signal in common to the comparison circuit in each column; and a signal conditioning circuit provided in a common signal path for providing the comparison signal from the comparison signal generating unit to the comparison circuit in each column, wherein the signal conditioning circuit includes: a source follower circuit that is provided to the signal path and includes a first current source having a transistor, and an amplification transistor having a gate oxide film that is thinner than a gate oxide film of the transistor; and a voltage control circuit that controls a drain-to-source voltage of the amplification transistor.
地址 Osaka JP