发明名称 METHOD OF FORMING EPITAXIAL FILM HAVING DEFECT-FREE REGION ON SUBSTRATE, AND SUBSTRATE WITH EPITAXIAL FILM HAVING DEFECT-FREE REGION
摘要 <p>PROBLEM TO BE SOLVED: To solve such a problem that when forming an epitaxial film of a harder material than a relatively soft substrate, e.g., a metal substrate, on the substrate, a stress due to lattice matching therebetween causes a defect on the substrate side, and it appears as the defect of the epitaxial film.SOLUTION: After forming an extremely shallow trench on the substrate surface, epitaxial growth is performed on that surface. Since a stress due to lattice matching is released in the trench and is not propagated nor stored over the entire substrate surface, when an arbitrary region on the substrate surface is isolated from the stress remotely by the trench, the defect is never formed in that region.</p>
申请公布号 JP2015162669(A) 申请公布日期 2015.09.07
申请号 JP20140039113 申请日期 2014.02.28
申请人 NATIONAL INSTITUTE FOR MATERIALS SCIENCE 发明人 YOSHITAKE MICHIKO;YAGYU SHINJIRO;CHIKYO TOYOHIRO
分类号 H01L21/316;C30B1/10;C30B29/20;H01L21/20 主分类号 H01L21/316
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