发明名称 METHOD OF FORMING A SEMICONDUCTOR STRUCTURE
摘要 A method of cleaning a semiconductor structure includes rotating a semiconductor structure. The method of cleaning further includes cleaning the semiconductor structure with a hydrogen fluoride (HF)-containing gas. A method of forming a semiconductor device includes forming a recess in a source/drain (S/D) region of a transistor. The method of forming further includes cleaning the recess with a HF-containing gas, the HF-containing gas having an oxide removing rate of about 2 nanometer/minute (nm/min) or less. The method of forming further includes epitaxially forming a strain structure in the recess after the cleaning the recess, the strain structure providing a strain to a channel region of the transistor.
申请公布号 US2015249011(A1) 申请公布日期 2015.09.03
申请号 US201514713211 申请日期 2015.05.15
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 YAO Liang-Gi;CHEN Chia-Cheng;KUAN Ta-Ming;XU Jeff J.;WANN Clement Hsingjen
分类号 H01L21/02;H01L21/8234;H01L29/78 主分类号 H01L21/02
代理机构 代理人
主权项 1. A method of cleaning a semiconductor structure, the method comprising: rotating a semiconductor structure; and cleaning the semiconductor structure with a hydrogen fluoride (HF)-containing gas.
地址 Hsinchu TW