| 摘要 |
PROBLEM TO BE SOLVED: To provide a component analyzing device and a component analyzing method which can execute highly accurate component analysis without damaging a measurement object. ! SOLUTION: A component analyzing device 10 comprises: a light source part 122 which emits light including a plurality of wavelength regions in a near-infrared wavelength region to a measurement object; a wavelength variable interference filter 5 which splits light with a prescribed wavelength from the light reflected on the measurement object and can change the prescribed wavelength; an imaging part 123 which receives the light emitted from the wavelength variable interference filter 5; a storage part which records correlation data in which the relationship between a feature quantity extracted from an absorption spectrum with respect to a prescribed analysis object component and a component content ratio to the feature quantity is recorded for each of the plurality of wavelength regions; and an arithmetic operation part |
