发明名称 METHOD AND APPARATUS OF STRESSED FIN NMOS FINFET
摘要 A semiconductor fin is on a substrate, and extends in a longitudinal direction parallel to the substrate. The fin projects, in a vertical direction, to a fin top at a fin height above the substrate. An embedded fin stressor element is embedded in the fin. The fin stressor element is configured to urge a vertical compression force within the fin, parallel to the vertical direction. Optionally, the semiconductor material includes silicon, and embedded fin stressor element includes silicon dioxide.
申请公布号 WO2015130507(A1) 申请公布日期 2015.09.03
申请号 WO2015US16081 申请日期 2015.02.17
申请人 QUALCOMM INCORPORATED 发明人 XU, JEFFREY JUNHAO;YEAP, CHOH FEI
分类号 H01L29/78;H01L29/36 主分类号 H01L29/78
代理机构 代理人
主权项
地址