PARTICLE INSPECTION UNIT AND PARTICLE INSPECTION SYSTEM

摘要

According to one embodiment, a particle inspection system includes an inspection module and a determination module. The inspection module includes a particle inspection chip configured to detect existence of particles in a sample liquid by a change in an electrical signal, and a memory element configured to store whether the inspection chip is a used chip or not. The determination module includes a determination circuit configured to determine the existence of the particles based on a detection signal of the inspection chip, and a control circuit configured to control an operation of the determination circuit from information in the memory element. The inspection chip and the determination circuit are electrically connected, and the memory element and the control circuit are electrically connected.