发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To perform an operation of impedance adjustment by a calibration circuit more successfully. ! SOLUTION: A semiconductor device comprises: a resistive element r2 connected to between a node N2 and a calibration terminal ZQ; a pull-up replica unit RU3 which is connected to the node N2 and in which impedance is controlled depending on an impedance code RPCODE; and a pull-down replica unit RU4 which is connected to the node N2 and fixed to an inactivated state. The impedance code RPCODE is created by a control circuit 111 depending on potential of the calibration terminal ZQ. According to the present embodiment, since the replica unit 101 having a circuit configuration the same with that of an output unit is used, an operation of impedance adjustment by a calibration circuit can be performed more successfully. ! COPYRIGHT: (C)2015,JPO&INPIT
申请公布号 JP2015159435(A) 申请公布日期 2015.09.03
申请号 JP20140033205 申请日期 2014.02.24
申请人 MICRON TECHNOLOGY INC 发明人 TAKEDA HIROMASA ; FUJISAWA HIROKI
分类号 H03K19/0175;G11C11/401;G11C11/4093 主分类号 H03K19/0175
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