发明名称 |
SEMICONDUCTOR DEVICE WITH METAL CARRIER AND MANUFACTURING METHOD |
摘要 |
Semiconductor device including a metal carrier substrate. Above the carrier substrate a first semiconductor layer of Alx1Gay1Inz1N (x1+y1+z1=1, x1≧0, y1≧0, z1≧0) is formed. A second semiconductor layer of Alx2Gay2Inz2N (x2+y2+z2=1, x2>x1, y2≧0, z2≧0) is arranged on the first semiconductor layer and a gate region is arranged on the second semiconductor layer. The semiconductor device furthermore includes a source region and a drain region, wherein one of these regions is electrically coupled to the metal carrier substrate and includes a conductive region extending through the first semiconductor layer. |
申请公布号 |
US2015249020(A1) |
申请公布日期 |
2015.09.03 |
申请号 |
US201514711198 |
申请日期 |
2015.05.13 |
申请人 |
Infineon Technologies Austria AG |
发明人 |
Haeberlen Oliver;Rieger Walter;Kadow Christoph;Zundel Markus |
分类号 |
H01L21/48;H01L21/768 |
主分类号 |
H01L21/48 |
代理机构 |
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代理人 |
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主权项 |
1. A method for manufacturing a semiconductor device, comprising:
attaching a front side of a semiconductor body to a first carrier, the semiconductor body including, in a sequence from a rear side to the front side, a semiconductor carrier substrate, a buffer layer including MN, a first semiconductor layer of Alx1Gay1Inz1N (x1+y1+z1=1, x1≧0, y1≧0, z1≧0) and a second semiconductor layer of Alx2Gay2Inz2N (x2+y2+z2=1, x2>x1, y2≧0, z2≧0); removing the semiconductor carrier substrate from the rear side; forming a metal substrate carrier on the rear side. |
地址 |
Villach AT |