| 摘要 |
PROBLEM TO BE SOLVED: To test whether or not an input buffer and output buffer operate normally. ! SOLUTION: A semiconductor device includes: a data input/output terminal DQa; a data output circuit 63 whose output node is connected to the data input/output terminal DQa; a data input circuit 64 whose input node is connected to the data input/output terminal DQa ; a read/write bus RWBUS that supplies an input node of the data output circuit 63 with test read data tRD which is read from a memory cell array 60; and a data comparison circuit 65a that compares test write data tWD and test read data tRD which is output from an output node of the data input circuit 64, to generate a determination signal TCMP0. The data input circuit 64 transfers the test read data tRD to the data comparison circuit 65a in response to a test clock signal SCLK, and the data comparison circuit 65a outputs a determination signal TCMP0 in response to the test clock signal SCLK. ! COPYRIGHT: (C)2015,JPO&INPIT |
