发明名称 DRY ETCHING GAS AND DRY ETCHING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a dry etching gas which allows for patterning of a contact hole, or the like, having a high aspect ratio.SOLUTION: The dry etching gas contains a compound having a CFCF fragment bonded directly to a double bond (excepting, CFCF=CFCF=CF). In particular, the dry etching gas preferably contains CFCF=CFand CHF.
申请公布号 JP2015159308(A) 申请公布日期 2015.09.03
申请号 JP20150077911 申请日期 2015.04.06
申请人 DAIKIN IND LTD 发明人 HIROSE ZENKO;NAKAMURA SHINGO;ITANO MITSUSHI;AOYAMA HIROICHI
分类号 H01L21/3065;H01L21/3105;H01L21/311;H01L21/768 主分类号 H01L21/3065
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