| 摘要 |
In described examples, a method of testing linearity of an ADC includes receiving (1310) a trigger signal indicating an ADC input voltage step adjustment, and reading (1311) an ADC output sample upon receiving the trigger signal. The ADC output sample has a value range of N integer values that correspond to N discrete ADC output codes. Also, the method includes computing (1312) a histogram of code occurrences for M consecutive ADC output codes. The histogram includes M number of bins corresponding to the M consecutive ADC output codes, where M is less than N. Further, the method includes updating a DNL value and an INL value according to the histogram at an interval of K number of ADC output sample readings, and shifting (1330) the histogram by one ADC output code after updating the DNL and the INL values. |
