TEST MEASUREMENT SYSTEM, ACCESSORY AND ACCESSORY COMPENSATION METHOD

摘要

PROBLEM TO BE SOLVED: To compensate for DC offset of an accessory head dynamically.SOLUTION: An accessory head 104 receives an input signal from a DUT 106, modulates an optical output signal of an optical sensor 400, and supplies the modulated signal to a controller 102 via a path 121. A compensation unit 108 receives a DC/low frequency (LF) component of the input signal and supplies digital data to the controller 102. An ADC 418 in the controller 102 generates the digital data of the DC/LF component of the optical output signal. A microcontroller 420 compares the input signal data from the compensation unit 108 with the optical output signal data for the DC/LF component. The compensation unit 108 receives the compensation bias data and biases the optical output signal with bias control electrodes 406 and 408 to compensate for it.