| 发明名称 |
DISPLAY DEVICE AND METHOD FOR MANUFACTURING SAME |
| 摘要 |
There is provided a display apparatus that can suppress the occurrence of a crack in a circularly polarizing plate in its manufacturing process without reducing designability and mass productivity. A display apparatus according to an embodiment of the present invention includes: a display element; and a circularly polarizing plate placed on a viewer side of the display element. The circularly polarizing plate includes a polarizer and a retardation film. In-plane retardations of the retardation film satisfy a relationship represented by the below-indicated expression (1); and an angle θ1 formed between a slow axis of the retardation film and a direction in which a wiring crimping portion provided along at least one side of a peripheral edge portion of the display element extends satisfies a relationship represented by the below-indicated expression (2):;Re(450)<Re(550) (1);θ1≦70° (2);where Re(450) and Re(550) represent in-plane retardations measured at 23° C., and at wavelengths of 450 nm and 550 nm, respectively. |
| 申请公布号 |
US2015249231(A1) |
申请公布日期 |
2015.09.03 |
| 申请号 |
US201314417243 |
申请日期 |
2013.07.04 |
| 申请人 |
NITTO DENKO CORPORATION |
发明人 |
Yaginuma Hironori;Takeda Kentarou;Shimizu Takashi;Uwada Kazuki;Murakami Nao |
| 分类号 |
H01L51/52;H01L27/32;H01L51/56;G02B5/30 |
主分类号 |
H01L51/52 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A display apparatus, comprising:
a display element; and a circularly polarizing plate placed on a viewer side of the display element, wherein: the circularly polarizing plate includes a polarizer and a retardation film; in-plane retardations of the retardation film satisfy a relationship represented by the below-indicated expression (1); and an angle θ1 formed between a slow axis of the retardation film and a direction in which a wiring crimping portion provided along at least one side of a peripheral edge portion of the display element extends satisfies a relationship represented by the below-indicated expression (2):
Re(450)<Re(550) (1)θ1≦70° (2).where Re(450) and Re(550) represent in-plane retardations measured at 23° C., and at wavelengths of 450 nm and 550 nm, respectively. |
| 地址 |
Ibaraki, Osaka JP |
