发明名称 Process of making a MOS transistor.
摘要 <p>The method involves delimiting an insulating region, and forming a gate region (G), source and drain regions which delimit a channel such that the gate region extends above the channel. The insulating region is formed by locally forming a zone formed of silicon-germanium alloy, selectively etching the alloy with respect to silicon and depositing a dielectric material at the etched place. The etching is performed after forming the gate region above a silicon-on-insulator semiconductor substrate deposited above a buried oxide layer. An independent claim is also included for an integrated circuit comprising a metal oxide semiconductor transistor.</p>
申请公布号 EP1746643(B1) 申请公布日期 2015.09.02
申请号 EP20060291159 申请日期 2006.07.18
申请人 STMICROELECTRONICS (CROLLES 2) SAS;COMMISSARIAT À L'ÉNERGIE ATOMIQUE ET AUX ÉNERGIESALTERNATIVES 发明人 CORONEL, PHILIPPE;GALLON, CLAIRE;FENOUILLET-BERANGER, CLAIRE
分类号 H01L21/762 主分类号 H01L21/762
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