发明名称 |
Process of making a MOS transistor. |
摘要 |
<p>The method involves delimiting an insulating region, and forming a gate region (G), source and drain regions which delimit a channel such that the gate region extends above the channel. The insulating region is formed by locally forming a zone formed of silicon-germanium alloy, selectively etching the alloy with respect to silicon and depositing a dielectric material at the etched place. The etching is performed after forming the gate region above a silicon-on-insulator semiconductor substrate deposited above a buried oxide layer. An independent claim is also included for an integrated circuit comprising a metal oxide semiconductor transistor.</p> |
申请公布号 |
EP1746643(B1) |
申请公布日期 |
2015.09.02 |
申请号 |
EP20060291159 |
申请日期 |
2006.07.18 |
申请人 |
STMICROELECTRONICS (CROLLES 2) SAS;COMMISSARIAT À L'ÉNERGIE ATOMIQUE ET AUX ÉNERGIESALTERNATIVES |
发明人 |
CORONEL, PHILIPPE;GALLON, CLAIRE;FENOUILLET-BERANGER, CLAIRE |
分类号 |
H01L21/762 |
主分类号 |
H01L21/762 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|