发明名称 SHAPE-MEASURING DEVICE
摘要 <p>[Object] Provided is a shape measuring apparatus capable of accurately identifying a relative position of an interference objective lens with respect to a stage at the time that a white light interference moire is imaged, without being affected by minute fluctuation in relative distance between the stage and an interference optical system originating from vibration of the shape measuring apparatus, tolerance of driving accuracy of a drive stage, temperature fluctuation, and distortion of parts, thereby measuring a workpiece shape. [Solution] A shape measuring apparatus (1) measures a workpiece shape utilizing white light interference, and includes a stage (10) on which a workpiece (W) is placed, an interference optical system (100) that irradiates the workpiece (W) with white light (WL) to generate a white light interference moire, a drive unit (26) that moves one of the stage and the interference optical system in a direction of an optical axis, a length measuring device (50) that measures a relative distance (L) between the stage and the interference optical system changed by the drive unit, and an imaging unit (40) that images the white light interference moire to acquire contrast information of the white light interference moire that changes according to the relative distance.</p>
申请公布号 EP2789968(A4) 申请公布日期 2015.09.02
申请号 EP20120854981 申请日期 2012.09.12
申请人 KONICA MINOLTA, INC. 发明人 MIKOSHIBA, HIRONOBU;TAKITANI, TOSHIYA
分类号 G01B9/02;G01B11/00;G01B11/24 主分类号 G01B9/02
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