发明名称 回路基板検査装置および回路基板検査方法
摘要 <p><P>PROBLEM TO BE SOLVED: To improve inspection efficiency and prevent a circuit board from being damaged. <P>SOLUTION: A circuit board inspection device includes an inspection unit that executes a first insulation inspection in which one of conductor patterns is set as a first inspection object, a part or all parts of other conductor patterns except the first inspection object are set as second inspection objects, and then an insulation state is inspected between the second inspection objects and the first inspection object. The inspection unit executes the first insulation inspection sequentially while setting one of conductor patterns from among conductor patterns only having less than the predetermined number of inspection object dots when there is a specific conductor pattern having the predetermined number or more of the inspection object dots. The inspection unit executes a second insulation inspection, after completion of the first insulation inspection, in which one specific conductor pattern is set as a third inspection object, other specific conductor patterns except the third inspection object are set as fourth inspection objects, and then an insulation state is inspected between the third inspection object and the fourth inspection objects, when there are a plurality of the specific conductor patterns. <P>COPYRIGHT: (C)2013,JPO&INPIT</p>
申请公布号 JP5773744(B2) 申请公布日期 2015.09.02
申请号 JP20110109108 申请日期 2011.05.16
申请人 发明人
分类号 G01R31/02 主分类号 G01R31/02
代理机构 代理人
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