| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To improve measurement accuracy of an electric field in an electric field probe and an electric field measurement device. <P>SOLUTION: The electric field probe 1 includes a central conductor 2, a first dielectric section 3 comprising a dielectric material and arranged at the outer periphery of the central conductor 2, and an outer conductor 4 arranged at the outer periphery of the first dielectric section 3. The electric field probe 1 further includes a second dielectric section 5 formed by covering an outer periphery 4b of the tip end side of the outer conductor 4 with a dielectric material. <P>COPYRIGHT: (C)2013,JPO&INPIT</p> |
