Semiconductor device

摘要

To determine the accuracy of an AD converter more simply than in the related art, a semiconductor device includes a successive approximation AD converter. The AD converter includes one or a plurality of testing capacitors used in a test mode, separately from a C-DAC used for AD conversion in a normal mode. In the test mode, the accuracy of a capacitor under test among a plurality of capacitors configuring the C-DAC is determined by comparing a potential occurring in the capacitor under test and a potential occurring in the testing capacitors.

主权项

1. A semiconductor device comprising a successive approximation AD (Analog-to-Digital) converter,
the AD converter comprising: a switching unit for switching between an analog signal and a reference potential; a first DA (Digital-to-Analog) converter including a plurality of first capacitors each having one end that can be individually coupled to the switching unit and the other end coupled to a common output line; one or a plurality of testing capacitors that are dedicated for testing, each having one end to which the reference potential or a potential obtained by dividing the reference potential can be individually inputted; and a control unit, wherein, in a normal mode, the control unit determines a digital value corresponding to the analog signal, based on the output line, and wherein, in a test mode, the control unit determines accuracy of a first capacitor under test by comparing a potential of the output line and a potential of the other end of the one or more testing capacitors in a state where the reference potential is inputted to one end of the first capacitor under test.