发明名称 |
Techniques for improving reliability of a fault current limiting system |
摘要 |
Techniques for improving reliability of a superconducting fault current limiting system (SCFCL) are provided. In one particular exemplary embodiment, the technique may be realized as a method of improving a reliability of a superconducting fault current limiting system (SCFCL), the SCFCL system comprising a superconductor provided in a container. The method may comprise providing one or more sensors capable of detecting a fault current proximate to the superconductor; determining a change in the condition of the superconductor as a result of the fault current; and estimating the lifetime of the superconductor based on the change in the condition of the superconductor. |
申请公布号 |
US9121879(B2) |
申请公布日期 |
2015.09.01 |
申请号 |
US201213493782 |
申请日期 |
2012.06.11 |
申请人 |
Varian Semiconductor Equipment Associates, Inc. |
发明人 |
Tekletsadik Kasegn D.;Murphy Paul J.;Amato Mark R.;Strassner James D. |
分类号 |
G01R31/25;G01R31/00;H02H9/08;G01R33/12;H02H7/00 |
主分类号 |
G01R31/25 |
代理机构 |
|
代理人 |
|
主权项 |
1. A method for improving a reliability of a superconducting fault current limiting system (SCFCL), the SCFCL system comprising a superconductor provided in a container, the method comprising:
providing one or more sensors capable of detecting a fault current proximate to the superconductor; determining a change in the condition of the superconductor as a result of the fault current, wherein the change in the condition of the superconductor comprises an increase in the number of hotspots in the superconductors as a result of the encountered fault current; estimating the lifetime of the superconductor based on the change in the condition of the superconductor; comparing, prior to the estimating the lifetime, a number of hotspots in the superconductor after the encountered fault current and a predetermined number, wherein the lifetime comprises a number of one or more additional fault currents the superconductor can encounter without a failure; and replacing the superconductor if the lifetime is less than 1 additional fault current. |
地址 |
Gloucester MA US |