Spectrometer apparatus using continuous wave laser and photomultiplier tube

摘要

Disclosed is a spectrometer apparatus using a continuous wave laser and a photomultiplier tube. The spectrometer apparatus includes a continuous wave laser irradiating part to irradiate a continuous wave laser to introduced particles, a scattering light measuring part to measure a scattering light emitted from the particles due to the continuous wave laser, a triggering signal generator to generate a triggering signal if a measurement value of the scattering light measuring part is greater than a preset value or equal to the preset value, a pulse laser irradiating part to receive the triggering signal to irradiate a pulse laser to the particles, and a spectral analysis part to measure an emission light generated from the particles due to the pulse wave laser to analyze elements consisting of the particles.

主权项

1. A spectrometer apparatus comprising:
a continuous wave laser irradiating part configured to irradiate a continuous wave laser to introduced particles; a scattering light measuring part configured to measure a scattering light emitted from the particles due to the continuous wave laser, wherein the scattering light measuring part comprises
a photo-multiplier tube configured to receive the scattering light, convert the scattering light to an electrical signal, and amplify the electrical signal, andan oscilloscope configured to receive the amplified electrical signal and calculate a voltage value based on the amplified electrical signal; a triggering signal generator configured to generate a triggering signal if the voltage value calculated in the oscilloscope within the scattering light measuring part is greater than a preset voltage value or equal to the preset voltage value; a pulse laser irradiating part configured to receive the triggering signal to irradiate a pulse laser to the particles, wherein,
the triggering signal generator applies the triggering signal to the pulse laser irradiating part if the voltage value calculated in the oscilloscope is greater than or equal to the preset voltage value; and a spectral analysis part configured to measure an emission light generated from the particles due to the pulse laser to analyze elements consisting of the particles, wherein a timing to apply the triggering signal to the pulse laser irradiating part is variably set according to a degree of the voltage value exceeding the preset voltage value, and wherein the timing of a particle causing a greater voltage value is set faster than the timing of a particle causing a less voltage value.