发明名称 INTEGRATED COOLING SYSTEM FOR ELECTRONICS TESTING APPARATUS
摘要 <p>Exemplary characteristics or aspects of the present invention are disclosed relating to a small quiet integrated cooling system for an electronics testing apparatus. Characteristics of the testing apparatus having low noise output, low power consumption, and compact size taking small space and volume are selected for the installation and use thereof in an office environment. The testing apparatus comprises a chassis frame and a cooler frame integrated into the testing apparatus by being arranged in the chassis frame, and includes a reduced form factor proper to installation in an office. Provided in an embodiment is an ability to maintaining an acting fluid at a certain temperature.</p>
申请公布号 KR20150098210(A) 申请公布日期 2015.08.27
申请号 KR20150023396 申请日期 2015.02.16
申请人 ADVANTEST CORPORATION 发明人 THORDARSON BRENT;ANDBERG JOHN W.;NISHIURA KOEI
分类号 G01R31/28 主分类号 G01R31/28
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