发明名称 CMOS IMAGE SENSORS HAVING A TRANSFER GATE ELECTRODE, AND METHODS OF FABRICATING CMOS IMAGE SENSORS HAVING A TRANSFER GATE ELECTRODE
摘要 Complementary metal-oxide-semiconductor (CMOS) image sensors are provided. A CMOS image sensor includes a substrate including a pixel array and a peripheral circuit region, a photodiode and a floating diffusion region in the pixel array of the substrate, a transfer gate insulating layer and a transfer gate electrode on the substrate between the photodiode and the floating diffusion region, and a peripheral gate insulating layer and a peripheral gate electrode on the peripheral circuit region. The transfer gate electrode includes a first edge that is rounded to have a first radius of curvature, and the peripheral gate electrode includes a second edge that is rounded to have a second radius of curvature smaller than the first radius of curvature.
申请公布号 US2015243701(A1) 申请公布日期 2015.08.27
申请号 US201414478374 申请日期 2014.09.05
申请人 Samsung Electronics Co., Ltd. 发明人 Oh Young-Sun;Lee Kyung-Ho;Jeong Hee-Geun
分类号 H01L27/146 主分类号 H01L27/146
代理机构 代理人
主权项 1. A complementary metal-oxide-semiconductor (CMOS) image sensor comprising: a substrate including a pixel array and a peripheral circuit region; a photodiode and a floating diffusion region in the pixel array of the substrate; a transfer gate insulating layer and a transfer gate electrode on a portion of the substrate that is between the photodiode and the floating diffusion region; and a peripheral gate insulating layer and a peripheral gate electrode on the peripheral circuit region, wherein the transfer gate electrode includes a first edge that is rounded to have a first radius of curvature, and wherein the peripheral gate electrode includes a second edge that is rounded to have a second radius of curvature shorter than the first radius of curvature.
地址 Suwon-si KR