发明名称 A METHOD AND APPARATUS FOR INTERNAL MARKING OF INGOTS AND WAFERS
摘要 A method of marking ingots and wafers using a laser to create fiducial marks in the bulk of the ingot or wafer. Disclosed is a method for creating durable, optically-recognizable fiducial marks for indicating single crystal ingot and wafer orientation and other types of information required by the chips manufacturers. The fiducial marks can be located at a controlled depth inside the silicon ingot or wafer bulk and the fiducial marks can be made of almost any shape.
申请公布号 WO2015125134(A1) 申请公布日期 2015.08.27
申请号 WO2015IL50168 申请日期 2015.02.15
申请人 GEM SOLAR LTD. 发明人 FINAROV, MOSHE;TIROSH, EHUD;DISHON, GIORA;GUSAROV, ALEXANDER
分类号 H01L23/544 主分类号 H01L23/544
代理机构 代理人
主权项
地址