发明名称 |
A METHOD AND APPARATUS FOR INTERNAL MARKING OF INGOTS AND WAFERS |
摘要 |
A method of marking ingots and wafers using a laser to create fiducial marks in the bulk of the ingot or wafer. Disclosed is a method for creating durable, optically-recognizable fiducial marks for indicating single crystal ingot and wafer orientation and other types of information required by the chips manufacturers. The fiducial marks can be located at a controlled depth inside the silicon ingot or wafer bulk and the fiducial marks can be made of almost any shape. |
申请公布号 |
WO2015125134(A1) |
申请公布日期 |
2015.08.27 |
申请号 |
WO2015IL50168 |
申请日期 |
2015.02.15 |
申请人 |
GEM SOLAR LTD. |
发明人 |
FINAROV, MOSHE;TIROSH, EHUD;DISHON, GIORA;GUSAROV, ALEXANDER |
分类号 |
H01L23/544 |
主分类号 |
H01L23/544 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|