发明名称 |
X-RAY INTERFEROMETRIC IMAGING SYSTEM |
摘要 |
An x-ray interferometric imaging system in which the x-ray source comprises a target having a plurality of structured coherent sub-sources of x-rays embedded in a thermally conducting substrate. The system additionally comprises a beam-splitting grating G1 that establishes a Talbot interference pattern, which may be a π phase-shifting grating, and an x-ray detector to convert two-dimensional x-ray intensities into electronic signals. The system may also comprise a second analyzer grating G2 that may be placed in front of the detector to form additional interference fringes, a means to translate the second grating G2 relative to the detector. The system may additionally comprise an antiscattering grid to reduce signals from scattered x-rays. Various configurations of dark-field and bright-field detectors are also disclosed. |
申请公布号 |
US2015243397(A1) |
申请公布日期 |
2015.08.27 |
申请号 |
US201514700137 |
申请日期 |
2015.04.29 |
申请人 |
Yun Wenbing;Lewis Sylvia Jia Yun;Kirz Janos |
发明人 |
Yun Wenbing;Lewis Sylvia Jia Yun;Kirz Janos |
分类号 |
G21K1/06;H01J35/16;G01N23/20;G21K1/10 |
主分类号 |
G21K1/06 |
代理机构 |
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代理人 |
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主权项 |
1. An x-ray interferometric imaging system comprising:
a source of x-rays comprising:
a vacuum chamber;an emitter for an electron beam; andan electron target comprising:
a substrate comprising a first material and, embedded in the substrate,at least a plurality of discrete structures comprising a second material selected for its x-ray generating properties,and in which said plurality of discrete structures
are arranged within a periodic pattern of sub-sources; a beam-splitting x-ray grating comprising periodic structures
that form an x-ray phase-shifting gratingpositioned to diffract x-rays generated by the sub-sources of x-rays; an x-ray detector comprising a two-dimensional array of x-ray detecting elements, positioned to detect the x-rays diffracted by the beam-splitting grating; and an antiscattering grid having periodic array of septa
comprising an x-ray absorbing materialpositioned between the beam splitting x-ray grating and the detector. |
地址 |
Walnut Creek CA US |