发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 The method of manufacturing a semiconductor device in accordance with the present invention provides a metal-containing film capable of adjusting a work function. The including: (a) alternately supplying a first source containing a first metal element and a halogen element and a second source containing a second metal element different from the first metal element and at least one selected from the group consisting of a ligand of a methyl group, a ligand of an ethyl group and a ligand of a cyclopenta-based group onto a substrate in a process chamber to form a composite metal-containing film on the substrate; and (b) alternately supplying a third source containing a third metal element and a fourth source containing nitrogen onto the substrate in the process chamber to form a metal nitride film on the composite metal-containing film.
申请公布号 US2015243507(A1) 申请公布日期 2015.08.27
申请号 US201514708004 申请日期 2015.05.08
申请人 Hitachi Kokusai Electric Inc. 发明人 HARADA Kazuhiro;OGAWA Arito;ASHIHARA Hiroshi
分类号 H01L21/28;H01L21/285 主分类号 H01L21/28
代理机构 代理人
主权项 1. A method of manufacturing a semiconductor device, comprising: (a) alternately supplying a first source containing a first metal element and a halogen element and a second source containing a second metal element different from the first metal element and at least one selected from the group consisting of a ligand of a methyl group, a ligand of an ethyl group and a ligand of a cyclopenta-based group onto a substrate in a process chamber to form a composite metal-containing film on the substrate; and (b) alternately supplying a third source containing a third metal element and a fourth source containing nitrogen onto the substrate in the process chamber to form a metal nitride film on the composite metal-containing film.
地址 Tokyo JP