发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
The method of manufacturing a semiconductor device in accordance with the present invention provides a metal-containing film capable of adjusting a work function. The including: (a) alternately supplying a first source containing a first metal element and a halogen element and a second source containing a second metal element different from the first metal element and at least one selected from the group consisting of a ligand of a methyl group, a ligand of an ethyl group and a ligand of a cyclopenta-based group onto a substrate in a process chamber to form a composite metal-containing film on the substrate; and (b) alternately supplying a third source containing a third metal element and a fourth source containing nitrogen onto the substrate in the process chamber to form a metal nitride film on the composite metal-containing film. |
申请公布号 |
US2015243507(A1) |
申请公布日期 |
2015.08.27 |
申请号 |
US201514708004 |
申请日期 |
2015.05.08 |
申请人 |
Hitachi Kokusai Electric Inc. |
发明人 |
HARADA Kazuhiro;OGAWA Arito;ASHIHARA Hiroshi |
分类号 |
H01L21/28;H01L21/285 |
主分类号 |
H01L21/28 |
代理机构 |
|
代理人 |
|
主权项 |
1. A method of manufacturing a semiconductor device, comprising:
(a) alternately supplying a first source containing a first metal element and a halogen element and a second source containing a second metal element different from the first metal element and at least one selected from the group consisting of a ligand of a methyl group, a ligand of an ethyl group and a ligand of a cyclopenta-based group onto a substrate in a process chamber to form a composite metal-containing film on the substrate; and (b) alternately supplying a third source containing a third metal element and a fourth source containing nitrogen onto the substrate in the process chamber to form a metal nitride film on the composite metal-containing film. |
地址 |
Tokyo JP |