发明名称 PHOTOSENSITIZATION CHEMICAL-AMPLIFICATION TYPE RESIST MATERIAL, METHOD FOR FORMING PATTERN USING SAME, SEMICONDUCTOR DEVICE, MASK FOR LITHOGRAPHY, AND TEMPLATE FOR NANOIMPRINTING
摘要 The photosensitization chemical-amplification type resist material according to the present invention is for use in a two-step-exposure lithography process and comprises (1) a developable base component and (2) a component that generates a photosensitizer and an acid upon light exposure. The component (2) comprises the ingredient (a) only among (a) an acid-photosensitizer generator, (b) a photosensitizer precursor, and (c) a photo-acid generator, or comprises any two or all of the three ingredients (a) to (c).
申请公布号 WO2015125788(A1) 申请公布日期 2015.08.27
申请号 WO2015JP54325 申请日期 2015.02.17
申请人 TOKYO ELECTRON LIMITED;OSAKA UNIVERSITY 发明人 NAGAHARA SEIJI;TAGAWA SEIICHI;OSHIMA AKIHIRO
分类号 G03F7/38;G03F7/004;G03F7/038;G03F7/039;G03F7/11;H01L21/027 主分类号 G03F7/38
代理机构 代理人
主权项
地址