发明名称 |
PHOTOSENSITIZATION CHEMICAL-AMPLIFICATION TYPE RESIST MATERIAL, METHOD FOR FORMING PATTERN USING SAME, SEMICONDUCTOR DEVICE, MASK FOR LITHOGRAPHY, AND TEMPLATE FOR NANOIMPRINTING |
摘要 |
The photosensitization chemical-amplification type resist material according to the present invention is for use in a two-step-exposure lithography process and comprises (1) a developable base component and (2) a component that generates a photosensitizer and an acid upon light exposure. The component (2) comprises the ingredient (a) only among (a) an acid-photosensitizer generator, (b) a photosensitizer precursor, and (c) a photo-acid generator, or comprises any two or all of the three ingredients (a) to (c). |
申请公布号 |
WO2015125788(A1) |
申请公布日期 |
2015.08.27 |
申请号 |
WO2015JP54325 |
申请日期 |
2015.02.17 |
申请人 |
TOKYO ELECTRON LIMITED;OSAKA UNIVERSITY |
发明人 |
NAGAHARA SEIJI;TAGAWA SEIICHI;OSHIMA AKIHIRO |
分类号 |
G03F7/38;G03F7/004;G03F7/038;G03F7/039;G03F7/11;H01L21/027 |
主分类号 |
G03F7/38 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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