发明名称 |
PRECISE PROBE PLACEMENT IN AUTOMATED SCANNING PROBE MICROSCOPY SYSTEMS |
摘要 |
A scanning probe microscope (SPM) system and associated method. The SPM system having a probe adapted to interact with nanoscale features of a sample and scan within a target region to produce a three-dimensional image of that target region, the system maintaining location information for a plurality of features of interest of the sample according to a sample- specific coordinate system, wherein the SPM system is configured to adjust positioning of the probe relative to the sample according to a SPM coordinate system, the SPM system further configured to manage a dynamic relationship between the sample-specific coordinate system and the SPM coordinate system by determining a set of alignment errors between the sample-specific coordinate system and the SPM coordinate system and apply corrections to the SPM coordinate system to offset the determined alignment errors. |
申请公布号 |
WO2015127449(A1) |
申请公布日期 |
2015.08.27 |
申请号 |
WO2015US17319 |
申请日期 |
2015.02.24 |
申请人 |
BRUKER NANO, INC. |
发明人 |
OSBORNE, JASON;MILLIGAN, ERIC;LOPEZ, ANDREW;WU, ROBERT;HAND, SEAN;FONOBEROV, VLADIMIR |
分类号 |
G01Q10/06;G01Q60/16;G01Q70/02 |
主分类号 |
G01Q10/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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