发明名称 半導体装置の作製方法
摘要 <p>A semiconductor device including an oxide semiconductor, which has stable electric characteristics and high reliability, is provided. In a method for manufacturing a transistor including an oxide semiconductor film, an implantation step where rare gas ions are implanted to the oxide semiconductor film is performed, and the oxide semiconductor film to which rare gas ions are implanted is subjected to a heating step under reduced pressure, in a nitrogen atmosphere, or in a rare gas atmosphere, whereby hydrogen or water contained in the oxide semiconductor film to which rare gas ions are implanted is released; thus, the oxide semiconductor film is highly purified.</p>
申请公布号 JP5770130(B2) 申请公布日期 2015.08.26
申请号 JP20120063019 申请日期 2012.03.21
申请人 发明人
分类号 H01L29/786;G09F9/30;H01L21/336;H01L21/363;H01L21/8242;H01L21/8247;H01L27/108;H01L27/115;H01L27/146;H01L29/788;H01L29/792;H01L51/50;H05B33/08;H05B33/10;H05B33/14 主分类号 H01L29/786
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