发明名称 |
METHOD AND APPARATUS TO DETERMINE IMPEDANCE VARIATIONS IN A SKIN/ELECTRODE INTERFACE |
摘要 |
<p>The present invention relates to a system for measuring the impedance of a skin/electrode interface and selectively modifying the system gain of the monitoring circuit to compensate for errors introduced by variations in the skin/electrode impedance. More particularly, a simplified, low-cost method for measuring and compensating for skin/electrode impedance variations is provided. The skin/electrode impedance measuring circuit and determines a system gain correction factor which may be applied to the measured signal using a software algorithm, thereby eliminating the need to change the circuit topology with a programmable gain amplifier or programmable resistor network.</p> |
申请公布号 |
EP2557989(A4) |
申请公布日期 |
2015.08.26 |
申请号 |
EP20110769453 |
申请日期 |
2011.04.12 |
申请人 |
REPRODUCTIVE RESEARCH TECHNOLGIES, LP |
发明人 |
BURNS, MARK;FINK, RAINER J. |
分类号 |
A61B5/053;A61B5/00;A61B5/04;A61B5/0402;A61B5/0428;A61B5/0476;A61B5/0488 |
主分类号 |
A61B5/053 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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