发明名称 半導体装置
摘要 <p>A semiconductor device that can improve reliability while suppressing increase of a conduction loss or a switching loss. In the semiconductor device, when a two-dimensional shape on a main surface of the semiconductor substrate is an unit cell, the shape being a repeating unit of a plurality of well regions periodically disposed in a surface layer of a drift layer, one unit cell and another unit cell adjacent in an x-axis direction are disposed misaligned in a y-axis direction, and one unit cell and another unit cell adjacent in the y-axis direction are disposed misaligned in the x-axis direction.</p>
申请公布号 JP5769818(B2) 申请公布日期 2015.08.26
申请号 JP20130547021 申请日期 2012.09.24
申请人 发明人
分类号 H01L29/78;H01L29/12;H01L29/739 主分类号 H01L29/78
代理机构 代理人
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