发明名称 MULTI-STACK FILM BOLOMETER
摘要 <p>A semiconductor device includes a substrate, suspension structures extending from the upper surface of the substrate, and an absorber stack attached to the substrate by the suspension structures. The suspension structures suspend the absorber stack over the substrate such that a gap is defined between the absorber stack and the substrate. The absorber stack includes a plurality of metallization layers interleaved with a plurality of insulating layers. At least one of the metallization layers has a thickness of approximately 10 nm or less.</p>
申请公布号 EP2909591(A1) 申请公布日期 2015.08.26
申请号 EP20130786040 申请日期 2013.10.16
申请人 ROBERT BOSCH GMBH;FEYH, ANDO, LARS;CHEN, PO-JUI;PURKL, FABIAN;YAMA, GARY;O'BRIEN, GARY 发明人 FEYH, ANDO LARS;CHEN, PO-JUI;PURKL, FABIAN;YAMA, GARY;O'BRIEN, GARY
分类号 G01J5/02;G01J5/08;G01J5/10;G01J5/20 主分类号 G01J5/02
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