发明名称 Scanner and process for detecting a scan lid open condition
摘要 A scanner and process for detecting a scan lid open condition. The scan lid open condition is detected by aligning two scan bars with one another, illumining one of the scan bars with a predetermined illumining pattern and during the illumining, scanning the illumined scan bar with the other scan bar. The response of the scanning scan bar is compared with an expected response for the illumining pattern with the scan lid closed. If a positive comparison occurs, the scan lid is closed. If a negative comparison occurs, the scan lid is open.
申请公布号 US9118784(B2) 申请公布日期 2015.08.25
申请号 US201213728077 申请日期 2012.12.27
申请人 Lexmark International, Inc. 发明人 Edwards Mark Joseph;NeCamp, II John Paul
分类号 G06K15/00;H04N1/00;H04N1/40 主分类号 G06K15/00
代理机构 代理人 Pezdek John Victor
主权项 1. A scanner comprising: a housing having a base and a scan lid openable with respect to the base; the base comprising: a platen;a first scan bar translateably mounted below the platen, the first scan bar having first light source having a plurality of LEDs; anda drive for translating the first scan bar; the scan lid comprising: a second scan bar with the first and second scan bars being alignable with one another, the second scan bar having a second light source having a plurality of LEDs; and a controller configurable to control operation of the first and second scan bars, and the drive, the controller configured to: align the first and second scan bars with one another;turn on the respective light source in one of the first and a second scan bars and directly illuminate the other of the first and second scan bars using a predetermined illumining pattern of light produced by one or more of the LEDs in the plurality of LEDs in the respective light source;perform, with the other of the first and second scan bars, a scan of the turned-on one of the first and second scan bars and the predetermined illuminq pattern of light thereof;compare the response of the scanning scan bar with an expected response for the predetermined illumining pattern with the scan lid closed; andupon a negative comparison, conclude that the scan lid is open.
地址 Lexington KY US
您可能感兴趣的专利