发明名称 Lithographic apparatus and method
摘要 A lithographic apparatus comprising an illumination system for providing a beam of radiation, a support structure for supporting a patterning device, the patterning device serving to impart the radiation beam with a pattern in its cross-section, a substrate table for holding a substrate, and a projection system for projecting the patterned radiation beam onto a target portion of the substrate, wherein the lithographic apparatus further comprises a patterning device masking blade provided with a hole, a diffusing material being located at the hole.
申请公布号 US9116446(B2) 申请公布日期 2015.08.25
申请号 US201113243528 申请日期 2011.09.23
申请人 ASML Netherlands B.V. 发明人 Voogd Robbert Jan;Kok Haico Victor;Moest Bearrach;Van Gils Petrus Franciscus
分类号 G03F9/00;G03F7/20 主分类号 G03F9/00
代理机构 Sterne, Kessler, Goldstein & Fox P.L.L.C 代理人 Sterne, Kessler, Goldstein & Fox P.L.L.C
主权项 1. A lithographic apparatus, comprising: an illumination system configured to provide a beam of radiation; a support structure configured to support a patterning device, the patterning device serving to impart the radiation beam with a pattern in its cross-section; a substrate table configured to hold a substrate; a projection system configured to project the patterned radiation beam onto a target portion of the substrate; and a patterning device masking blade provided with a hole comprising inner edges and a diffusing material being located in the hole and upstream of the inner edges such that the radiation beam passes through the diffusing material before it is incident upon the inner edges.
地址 Veldhoven NL